Comparison ledger
Advantest V 93000 PS 400 Pin Scale, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | V 93000 PS 400 Pin ScaleAdvantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest V 93000 | KLA 1007 |
| Specifications | ||
| Configuration | CTH - Compact Test Head[1] | — |
| Workstation | HP Z 800[1] | — |
| Operating system | Dual OS: Redhat 5.6 & 5.8[1] | — |
| Software Version | Redhat 5.6: SMT 6.5.3; 6.5.4: 7.1.2.3[1] | — |
| Software version | Redhat 5.8 SMT 7.1.2.3; 7.2.0.9; 7.2.3.0[1] | — |
| RFE (2x) | RFF (2x)[1] | — |
| Chiller | Yes - E 2760 FA[1] | — |
| Make | Advantest[1] | KLA[4] |
| Model | V 93000 PS 400[1] | 1007[3] |
| Category | Test & Probe[2] | — |
| Tool type | semiconductor test system[2] | — |
| Test head | CTH - Compact Test Head[2] | — |
| Card/Board | PS 400 (4x)[1] | — |
| Manufacturer | — | KLA[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Equipment type | — | Prober[4] |
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