Comparison ledger
Agilent 11980 A, Wyko IR3, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11980 AAgilent | IR3Wyko |
|---|---|---|
| OEM | Agilent | Wyko |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 11980 A | Wyko IR3 |
| Specifications | ||
| Wavelength Range | 1250-1600 nm[1] | — |
| type | — | fully configured phase shifting interferometer[2] |
| measurement focus | — | automatic wavefront and surface analysis of IR transmitting materials and systems[2] |
| laser wavelength | — | 10.6 µm[2] |
| test modes | — | transmission and reflection[2] |
| accuracy | — | to l/50[2] |
| beam diameter range | — | 19 mm (0.75 in.) up to 304 mm (12 in.)[2] |
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