Comparison ledger
Agilent 11980 A, Zygo PTI 250, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11980 AAgilent | PTI 250Zygo |
|---|---|---|
| OEM | Agilent | Zygo |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 11980 A | Zygo PTI 250 |
| Cited variants | — | |
| Specifications | ||
| Wavelength Range | 1250-1600 nm[2] | — |
| Instrument type | — | Compact Fizeau phase-measuring interferometer[1] |
| Test source | — | Class I 655 nm semiconductor laser[1] |
| Test beam diameter | — | 25 mm[1] |
| CCD resolution | — | 640 x 480 pixels[1] |
| Focus range | — | ±250 mm manual[1] |
| Software | — | Zygo PTI 250 software on Microsoft Windows XP Professional[1] |
| Power supply | — | 100-240 VAC, 50/60 Hz[1] |
| Dimensions (H x W x D) | — | 686 x 203 x 356 mm[1] |
| Weight | — | 33 kg[1] |
| Measurement uncertainty (flat) | — | λ/20[1] |
| Measurement uncertainty (spherical RMS) | — | λ/10 RMS[1] |
| Repeatability (1σ RMS) | — | λ/2000[1] |
| Accuracy (1σ) | — | λ/500[1] |
| Operating temperature | — | 15°C to 35°C[1] |
| Temperature variation | — | <1.0°C / 15 min[1] |
| Humidity | — | 10% to 95% non-condensing[1] |
| Vibration isolation requirement | — | None (no special vibration isolation)[1] |
| Languages | — | English, German, Japanese, Simplified Chinese, Traditional Chinese[1] |
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