Comparison ledger
Applied Materials 0010-03485 Magnet Assy, Veeco 4-point, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03485 Magnet AssyApplied Materials | 4-pointVeeco |
|---|---|---|
| OEM | Applied Materials | Veeco |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-03485 Magnet Assy | Veeco 4-point |
| Specifications | ||
| Configuration | WP AL 300mm PVD[1] | — |
| OEM | Applied Materials[1] | — |
| Model | 0010-03485[1] | — |
| Description | MAGNET ASSY, WP AL 300MM PVD[2] | — |
| Process | PVD[3] | — |
| Wafer size | 300mm[4] | — |
| Version | Spares[4] | — |
| Part Number | 0010-03485[1] | — |
| Manufacturer | Applied Materials[1] | — |
| Process Type | PVD (Physical Vapor Deposition)[1] | — |
| Application (Material) | Aluminum (AL)[1] | — |
| Wafer Diameter (associated) | 300 mm[1] | — |
| Listed in metrology suite | — | Veeco 4-point probe[5] |
| Maximum substrate size | — | 6 inch[6] |
| Measurement capabilities | — | Sheet resistance, slice resistivity, V/I, metallization thickness, P‑N type testing[7] |
| Probe mechanism | — | Wafer is moved into the probe head, not vice versa[7] |
| Measurement Capabilities | — | Sheet resistivity, slice resistivity, metallization thickness, P-N type testing[7] |