Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, JEOL JSM-7500F, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | JSM-7500FJEOL |
|---|---|---|
| OEM | Applied Materials | JEOL |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | JEOL JSM-7500F |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | — |
| Instrument type | — | Scanning Electron Microscope (SEM)[2] |
| Model designation | — | JEOL 7500F HRSEM[2] |
| Resolution at 30 kV | — | 0.8 nm[2] |
| Resolution at 1 kV | — | 1 nm[2] |
| Detectors | — | Secondary electron, backscattered electron, and scanning-transmission electron detectors[2] |
| Imaging mode | — | Gentle-beam mode via stage biasing system[2] |
| Chemical characterization | — | EDAX Energy Dispersive x-ray spectrometer (EDS) available for spectra or element maps[2] |
| Gentle beam mode | — | Stage biasing system reduces electron beam energy for imaging soft or insulating samples without coating[2] |
| EDS | — | EDAX Energy Dispersive x-ray spectrometer available[2] |
| Electron Source | — | field emission electron gun (field emission SEM)[3] |
| Lens Type | — | semi-in-lens type objective lens[3] |
| Unique Feature | — | Gentle Beam (GB mode) for top-surface imaging with ultra-low energy incident electrons[4] |
| Application | — | high-resolution imaging of large specimens; suitable for observing shallow surfaces of samples[3] |
| Electron Gun Type | — | Field emission[3] |
| Objective Lens Type | — | Semi-in-lens[3] |
| Beam Mode | — | Gentle Beam (GB)[3] |
| Low Voltage Capability | — | Down to several hundred eV[3] |
| Resolution Quality | — | Extremely high (stated)[3] |
| Application Focus | — | Observation of shallow surfaces[3] |
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