Comparison ledger
Applied Materials 0720 06060 Part, Multitest InStrip Parallel Strip, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | InStrip Parallel StripMultitest |
|---|---|---|
| OEM | Applied Materials | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Multitest InStrip Parallel Strip |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[1] | Set up for MEMS[2] |
| Capability | — | High parallel test handling for ASICS and sensors in strips and singulated devices[2] |
| Handling Mechanism | — | InCarrier concept[2] |
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