Waferpedia

Comparison ledger

0720 06060 PartversusMT 8501

Applied Materials 0720 06060 Part, Multitest MT 8501, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0720 06060 PartApplied Materials
MT 8501Multitest
OEMApplied MaterialsMultitest
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0720 06060 PartMultitest MT 8501
Specifications
ConfigurationContact Pin 24-20 Awg Crimp Gold Flash[1]Handler with kit for DIP 300 mil[4]
Equipment type—Test Handler[2]
Category—Test & Probe[3]
Package Configuration—DIP 300 mil[4]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]Equipment inventory listing
  3. [3]waferpedia.comwaferpedia.com
  4. [4]fabsurplus.comfabsurplus.com