Comparison ledger
Applied Materials 0720 06060 Part, Spea 4060 Flying, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | 4060 FlyingSpea |
|---|---|---|
| OEM | Applied Materials | Spea |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Spea 4060 Flying |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[1] | 4 Probes with Active Shield — reduces noise in high-precision analogue measurements (not standard)[2] |
| Double Booster | — | ±40V/3A/100W + ±100V/1A/100W — for power component testing (IGBT, MOSFET, power devices)[2] |
| Full self-test | — | all systems PASS — zero errors[2] |
| Manufacturer | — | Spea[2] |
| Model | — | 4060 Flying[2] |
| Category | — | Test & Probe[3] |
| Type | — | Flying probe tester[3] |
| Probe count | — | 4 probes[3] |
| Active shield | — | 4 probes with Active Shield[2] |
| Frequency Divider option | — | On the 64-ch Scanner[2] |
| Driver | — | ±50V[2] |
| DVM | — | ±100V, AC/DC, 2µs[2] |
| Firmware | — | 09.12 (build 16620)[2] |
| Self-test status | — | All systems PASS; zero errors[2] |
| Software | — | Leonardo YA 2018 Vintage[2] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →