Comparison ledger
Cascade Microtech M 150, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | M 150Cascade Microtech | 1007KLA |
|---|---|---|
| OEM | Cascade Microtech | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cascade Microtech M 150 | KLA 1007 |
| Specifications | ||
| Maximum wafer size | 150 mm[1] | — |
| Number of manipulators | 4[1] | — |
| Measurement range | DC to high-frequency RF[1] | — |
| Chuck type | Vacuum[1] | — |
| Probe movement | Three-axis[1] | — |
| Microscope | Optical[1] | — |
| Probe card support | Yes[1] | — |
| Wafer positioning | Die-by-die stepping[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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