Waferpedia

Comparison ledger

1034versusEHS-222M-L

Electroglas 1034, Espec EHS-222M-L, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
1034Electroglas
OEMElectroglasEspec
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyElectroglas 1034Espec EHS-222M-L
Cited variants—
Specifications
Category—Highly accelerated stress test system (HAST chamber)[1]
Model—EHS-222M-L[1]
Interior dimensions—φ394×L626 mm[1]
Temperature range—+105.0°C to +142.9°C[1]
Humidity range—75% to 100% RH[1]
Pressure range (gauge)—0.019 to 0.193 MPa[1]
Interior dimensions (diameter × depth)—φ394 × L626 mm[1]
Maximum board size—290 × 460 mm[2]
Number of bias terminals—120[2]
Maximum bias voltage—1,000 V[2]
Control modes—Wet and dry bulb temperature control (M type), unsaturated control, wet saturated control[1]
Standards conformance—IEC60068-2-66,IEC60749–4,EIAJ ED-4701,JESD22-A110E,JESD22-A102E[1]
Power suppy—200V AC 1φ 50/60Hz,220V AC 1φ 50/60HHz, 230V AC 1φ 50Hz[1]

Plan your fab

Building a Test & Probe process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]espec.co.jpespec.co.jp
  2. [2]circuitsassembly.comcircuitsassembly.com