Comparison ledger
JEOL DA-1, KLA 0035235-003 MMD Head, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | DA-1JEOL | |
|---|---|---|
| OEM | JEOL | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | Electron microscope | — |
| Introduced | 1947 | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | JEOL DA-1 | KLA 0035235-003 MMD Head |
| Specifications | ||
| Type | prototype magnetic field–type electron microscope[1] | — |
| Developer context | developed by an initial group that included Kenji Kazato and Kazuo Ito in Mobara, Chiba Prefecture, Japan[1] | — |
| Development status | prototype[1] | — |
| Instrument type | magnetic field–type electron microscope[1] | — |
| First commercialized | 1947[1] | — |
| Historical note | described as the origin of developing the electron microscope by JEOL Ltd.[2] | — |
| Historical recognition | registered in 2010 as an Important Historical Scientific and Technical Material (Future Technology Heritage)[3] | — |
| Configuration | — | TSTD PCB ASSY, MMD MEAS HEAD[4] |
| Model | — | 0035235-003[4] |
| Make | — | KLA[4] |
| Part Description | — | TSTD PCB ASSY, MMD MEAS HEAD[4] |
| Compatible System | — | KLA AIT-XP[4] |
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