Comparison ledger
JEOL JEM-7, KLA 0035235-003 MMD Head, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | JEM-7JEOL | |
|---|---|---|
| OEM | JEOL | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | 1964 | — |
| Production run | 1964– | — |
| Lifecycle | Legacy | — |
| Lifecycle milestones | 1964 Introduction | — |
| Control system | — | — |
| Generation | — | — |
| Family | JEOL JEM-7 | KLA 0035235-003 MMD Head |
| Specifications | ||
| Manufacturer | JEOL[1] | — |
| Model | JEM-7[1] | 0035235-003[2] |
| Type | Electron microscope[1] | — |
| Introduced | 1964[1] | — |
| Notable feature | First electron microscope to include a mechanism for electrical adjustment of the lens axis[1] | — |
| First electronic microscope with electrical lens axis adjustment | Yes[1] | — |
| Configuration | — | TSTD PCB ASSY, MMD MEAS HEAD[2] |
| Make | — | KLA[2] |
| Part Description | — | TSTD PCB ASSY, MMD MEAS HEAD[2] |
| Compatible System | — | KLA AIT-XP[2] |
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