Comparison ledger
KLA 1.112 PSL Wafer, YXLON UX50, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | UX50YXLON | |
|---|---|---|
| OEM | KLA | YXLON |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1.112 PSL Wafer | YXLON UX50 |
| Specifications | ||
| Configuration | NIST Traceable[1] | — |
| Wafer Size | 8 inch[1] | — |
| NIST Traceable | True[1] | — |
| Compatible Tools | Surfscan 6xy0 and Sp1[2] | — |
| inspection type | — | CT inspection system[3] |
| use environment | — | production environments[3] |
| target parts | — | large and dense parts[3] |
| operation | — | easy and ergonomic operation[3] |
| detector flexibility | — | flat-panel and/or line detector[3] |
| CT technologies | — | cone-beam and fan-beam scans; circular and helical CT; horizontal and vertical field-of-view extensions[3] |
| image quality features | — | metal artifact reduction and ScatterFix[3] |
| inspection envelope | — | exceptional inspection envelope[4] |
| output | — | 2D and 3D results in record time[4] |
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