Comparison ledger
KLA .496 PSL Wafer, Leica DM2700, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | DM2700Leica | |
|---|---|---|
| OEM | KLA | Leica |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .496 PSL Wafer | Leica DM2700 |
| Cited variants | — | |
| Specifications | ||
| Configuration | NIST Traceable[2] | — |
| Wafer size | 8 inch[2] | — |
| Traceability | NIST Traceable[2] | — |
| Compatible systems | Capable on Surfscan 6xy0 and SP1[2] | — |
| Category | Metrology & Inspection[3] | — |
| Model | — | DM2700[4] |
| OEM | — | Leica[4] |
| Equipment type | — | Upright Materials Microscope / Optical Microscope[4] |
| Location | — | SEEL 181E[4] |
| Operating modes | — | Transmission and reflecting modes[4] |
| Illumination | — | White light LED illumination[4] |
| Imaging modes | — | Bright field and dark field observation[4] |
| Rate table entry | — | Optical Microscope Leica DM2700 Upright[5] |
| Illumination Type | — | Universal white light LED[6] |
| LED Color Temperature | — | 4500 K[6] |
| Contrast Methods (Incident Light) | — | Brightfield, Darkfield, Polarization, Differential Interference Contrast (DIC), Fluorescence, Oblique Illumination[1] |
| Contrast Methods (Transmitted Light) | — | Brightfield, Darkfield, Phase Contrast, Polarization, Differential Interference Contrast (ICT)[1] |
| Objective Turret | — | Manual; 6x or 7x for objectives with M25 thread; 5x for objectives with M32 thread[1] |
| Magnification Changer | — | Manual; steps: 1x, 1.5x, 2x[1] |
| Maximum Sample Size | — | 100 × 100 mm (foils, wafers, PCBs); thickness up to 80 mm[6] |
| Ambient Temperature Range | — | 15–35 °C[1] |
| Relative Humidity (non-condensing) | — | Max. 80% up to 30 °C[1] |
| Supply Voltage | — | 100 – 240 VAC[7] |
| Weight (fully equipped) | — | More than 18 kg[1] |
| Microscope Type | — | Upright materials microscope[4] |
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