Comparison ledger
Multitest InStrip Parallel Strip, Tektronix 11401 Oscilloscope, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | InStrip Parallel StripMultitest | 11401 OscilloscopeTektronix |
|---|---|---|
| OEM | Multitest | Tektronix |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Multitest InStrip Parallel Strip | Tektronix 11401 Oscilloscope |
| Specifications | ||
| Configuration | Set up for MEMS[1] | — |
| Capability | High parallel test handling for ASICS and sensors in strips and singulated devices[1] | — |
| Handling Mechanism | InCarrier concept[1] | — |
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