Comparison ledger
Accretech UF 300 A Automatic Wafer, Eagle ETS 200 T, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | UF 300 A Automatic WaferAccretech | ETS 200 TEagle |
|---|---|---|
| OEM | Accretech | Eagle |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | 2001 Vintage | — |
| Control system | — | — |
| Generation | — | — |
| Family | Accretech UF 300 | Eagle ETS 200 T |
| Cited variants | — |
|
| Specifications | ||
| Configuration | Nickel chuck[3] | with Electroglas EG 4090 Prober[1] |
| Phase | 1 Phase[3] | — |
| Cognex board type | 8200[4] | — |
| Voltage | 208V[4] | — |
| OEM | Accretech / TSK[3] | — |
| Model | UF 300 A[3] | ETS 200 T[1] |
| Equipment type | Automatic Wafer Prober[3] | — |
| Wafer size | 8 inch[3] | — |
| Chuck | Nickel chuck[3] | — |
| Power | 1 Phase[3] | — |
| Vintage | 2001[3] | 2006[1] |
| Keyboard/joystick | Keyboard, joystick[4] | — |
| Storage | 3.5" floppy disk / 3.5" hard disk[4] | — |
| Printer | Internal printer[4] | — |
| Interfaces | GPIB I/F, RS232 I/F, Ethernet I/[4] | — |
| Functions | Probe mark inspection; automatic probe to pad alignment; multi-die probing up to 256 DUTs; multi function cleaning pad; automatic needle height alignment; soak time option; new E2 camera update[4] | — |
| Chuck Type | Nickel chuck (some units) or gold plated chuck (other units)[4] | — |
| Automation | Fully automatic[4] | — |
| Probe Card Change | Included[4] | — |
| User Interface | Keyboard, joystick, 3.5" floppy disk / hard disk, internal printer[4] | — |
| Vision System | Cognex board type 8200, New E2 camera update[4] | — |
| Probing Features | Multi-die probing up to 256 DUTs, automatic probe to pad alignment, probe mark inspection, automatic needle height alignment[4] | — |
| Cleaning | Multi function cleaning pad[4] | — |
| Soak Option | Soak time option[4] | — |
| Product type | — | Tester[1] |
| Make | — | Eagle[1] |
| Discrete test platform | — | Built on proven ETS technology[2] |
| Testing mode | — | True index-parallel testing[2] |
| Handler compatibility | — | Turret and rotary handlers[2] |
| Applications | — | Wafer sort to final test for MOSFETs[2] |
| Integrated measurements | — | UIL, dVSD, Qg and LCR meter[2] |
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