Comparison ledger
Agilent 11980 A, Perkin Elmer QSight 420 Mass, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11980 AAgilent | QSight 420 MassPerkin Elmer |
|---|---|---|
| OEM | Agilent | Perkin Elmer |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 11980 A | Perkin Elmer QSight 420 Mass |
| Specifications | ||
| Wavelength Range | 1250-1600 nm[1] | — |
| Mass Analyzer | — | Quadrupole mass analyzer[2] |
| Ion Source | — | Dual Source with ESI and APCI Independent Probes[2] |
| Ion Polarity | — | Positive and Negative[2] |
| Mass Range | — | 10 to 1000 Da[2] |
| Data Acquisition Modes | — | Full Scan, MRM, SIM, Product Ion Scan, Neutral gain/loss scan[2] |
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