Comparison ledger
Applied Materials 0010-03254 E Chuck, FormFactor CM 300 xi, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03254 E ChuckApplied Materials | CM 300 xiFormFactor |
|---|---|---|
| OEM | Applied Materials | FormFactor |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | FormFactor CM 300 xi |
| Cited variants | — |
|
| Specifications | ||
| OEM | — | FormFactor[2] |
| Model | — | CM 300 xi[2] |
| Product type | — | 300 mm semi-/fully-automated probe system[3] |
| Wafer size | — | 300 mm[3] |
| Automation | — | Semi-automated and fully-automated[3] |
| Contact Intelligence | — | Supported[3] |
| Wafer handling capacity | — | Up to fifty 200 mm or 300 mm wafers[3] |
| Cassette type | — | SEMI-standard wafer cassettes[3] |
| Optional alignment feature | — | ReAlign off-axis probe-to-pad alignment[3] |
| Temperature range | — | -60°C to +300°C[3] |
| MicroChamber environment | — | EMI-shielded, light-tight and moisture-free test environment[3] |
| Variant designation | — | CM300xi-ULN[1] |
| ULN product type | — | 300 mm probe station for ultra low noise measurements[1] |