Comparison ledger
ASML TWINSCAN NXE:3800E, SUSS MicroTec 150 e Mask, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 150 e MaskSUSS MicroTec | |
|---|---|---|
| OEM | ASML | SUSS MicroTec |
| Category | Lithography | Lithography |
| Wafer size | — | — |
| Process node | 2 nm Logic nodes and leading-edge DRAM nodes | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | ASML TWINSCAN NXE:3800E | SUSS MicroTec 150 e Mask |
| Specifications | ||
| lightSource | 13.5 nm EUV[1] | — |
| numericalAperture | 0.33[1] | — |
| stageType | dual-stage[1] | — |
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