Comparison ledger
KLA 1007, Seiko Epson TR 60 High Speed, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | TR 60 High SpeedSeiko Epson |
|---|---|---|
| OEM | KLA | Seiko Epson |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Seiko Epson TR 60 High Speed |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | TR 60[3] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | Seiko / Epson[3] |
| Equipment type | Prober[2] | High Speed IC Handler[3] |
| Configuration | — | Additional hardware i.e. change kits:[3] |
| Additional hardware i.e. change kits | — | 3x3 QFN; 4x4 QFN; 6x6 QFN; 7x7 QFN; 8x8 QFN; 9x9 QFN; 10x10 BGA[3] |
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