Comparison ledger
KLA 1007, Teradyne Spectrum 8852, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Spectrum 8852Teradyne |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne Spectrum |
| Specifications | ||
| Manufacturer | KLA[1] | Teradyne[3] |
| Model | 1007[1] | Spectrum 8852[3] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | 2003[3] |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Power | — | 5.50v, 200.00w[3] |
| Configuration | — | Hardware scan table[3] |
| Category | — | Test & Probe[4] |
| Hardware scan table | — | present[3] |
| VXI-MXI-2 | — | present[3] |
| FIB / DeltaScan board | — | present[3] |
| VP board | — | 2[3] |
| CC2a master and expander board | — | 24[3] |
| Configured for | — | 208 vac[5] |
| Software | — | Spectrum software B0.28[5] |
| Control system | — | PC Win XP Pro[6] |
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