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The Gaertner L116SF is an ellipsometer used to measure film thickness. The Gaertner L116SF was equipped with a He-Ne laser at 632.8 nm and set at an incident angle of 70°.
Gaertner MI108 is a light-sectioning microscope designed for technical testing and measurement of surface features.
The Gaertner MI108E is a light-sectioning microscope designed for technical testing and measurement of surface geometry.