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Chroma

3380 P

Chroma 3380 P family
Research Quality: 40% complete

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Chroma3380 P
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What it is

The Chroma 3380P is a VLSI test system manufactured by Chroma ATE Inc.[2][1][3]

The Chroma 3380P features an all-in-one design with only a test head, providing a small footprint and low power consumption.[1]

How it works

The Chroma 3380P operates with a clock rate of 50/100 MHz and a data rate of 50/100 Mbps.[1][3]

The Chroma 3380P supports up to 1024 I/O pins, expandable to a maximum of 1280 I/O pins.[1]

The Chroma 3380P can perform parallel testing on up to 1024 sites simultaneously.[1]

The Chroma 3380P has pattern memory capacities of 32M, 64M, or 128M and 16M capture memory per pin.[1]

The Chroma 3380P uses a flexible hardware architecture with interchangeable I/O, VI (voltage/current source), and ADDA (analog-to-digital/digital-to-analog) boards.[1][3]

The Chroma 3380P includes a real parallel trim/match function and a time and frequency measurement unit (TFMU).[1]

The Chroma 3380P operates on the Windows 7 operating system and uses the CRAFT C/C++ programming language for test program development.[1][3]

Where it fits in the process flow

Test fixtures for the Chroma 3380P include a direct-mount fixture compatible with 3360P probe cards and a cable-mount fixture compatible with 3360D and 3360P systems.[3]

Applications

The Chroma 3380P is used for testing logic devices, microcontrollers (MCU), mixed-signal devices (ADDA), power devices, LED drivers, Class D amplifiers, SCAN test, ALPG (algorithmic pattern generator) for memory, and match functions.[1][3]

The Chroma 3380P supports optional features including AD/DA test (16/24 bits), SCAN vector storage depth up to 2G bits per chain, and ALPG test for embedded memory.[1][3]

What do the numbers mean?

Power & electrical1

Clock rate
50/100 MHz[1]
Accurate?

Configuration & options23

Data rate
50/100 Mbps[1]
Accurate?
I/O pins
1024 I/O pins (max. 1280 I/O pins)[1]
Accurate?
Parallel testing
Up to 1024 sites parallel testing[1]
Accurate?
Pattern memory
32/64/128 pattern memory[1]
Accurate?
Capture memory per pin
16M capture memory per pin[1]
Accurate?
VI source
Various VI source[1]
Accurate?
Hardware architecture
Flexible hardware architecture with interchangeable I/O, VI, and ADDA[1]
Accurate?
Trim/match function
Real parallel trim/match function[1]
Accurate?
Measurement unit
Time and frequency measurement unit (TFMU)[1]
Accurate?
STDF tools support
Supported[1]
Accurate?
Test program/pattern converter
Supported; J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.[1]
Accurate?
AD/DA test
Option[1]
Accurate?
SCAN test
Option; max. 2G M/chain[1]
Accurate?
ALPG test
Option for embedded memory[1]
Accurate?
Programming language
CRAFT C/C++[1]
Accurate?
Operating environment
User-friendly Windows 7 environment[1]
Accurate?
Design
All-in-one design for test head only[1]
Accurate?
Product type
VLSI test system[1]
Accurate?
Hardware architecture
Flexible hardware architecture (interchangeable I/O, VI, ADDA)[1]
Accurate?
STDF support
STDF tools support[1]
Accurate?
Test program/pattern converter
Supports J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.[1]
Accurate?
Programming language
CRAFT C/C++ programming language[1]
Accurate?
Operating environment
Windows 7 environment[1]
Accurate?
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Clock rate50/100 MHz[1]

Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What clock and data rates does the Chroma 3380P support?

The Chroma 3380P supports a 50/100 MHz clock rate and a 50/100 Mbps data rate.[1][3]

How many I/O pins can the Chroma 3380P use?

The Chroma 3380P provides 1024 I/O pins and supports a maximum of 1280 I/O pins.[1][3]

How much parallel testing does the Chroma 3380P support?

The Chroma 3380P supports up to 1024 sites parallel testing.[1][3]

What optional measurement or test functions are available on the Chroma 3380P?

The Chroma 3380P offers AD/DA test as an option, SCAN test as an option with up to 2G M/chain, and ALPG test option for embedded memory.[1][3]

Not publicly documented

The following facts about the 3380 P are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 3380 P are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 3380 P are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 3380 P are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 3380 P are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 3380 P is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]chromaate.com — chromaate.comchromaate.com
  2. [2]Equipment inventory listing
  3. [3]Chroma 3380P VLSI 測試系統 — chromaate.comchromaate.com
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Last updated Oct 6, 2026.

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