KLA
The KLA 5200 is an overlay metrology system. The KLA 5200 uses Coherence Probe Microscopy (CPM), a patented white-light interferometric technique. The KLA 5200 can measure feature sizes down to .18 µm.[1]

The KLA 5200 uses Coherence Probe Microscopy, a white-light interferometric technique that identifies surfaces rather than only edges.[1]
The KLA 5200 includes built-in analysis software and a graphical user interface for production operation, in-line process qualification, and off-line engineering analysis.[1]
The KLA 5200 supports chipmakers in tightening process specifications, improving process control, and reducing lithography-related delay in product introduction.[1]
The KLA 5200 is used for overlay metrology for advanced lithography.[1]
The KLA 5200 is intended for measuring all layers, including low-contrast or grainy targets.[1]
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The KLA 5200 is a comprehensive overlay metrology system.[1]
The KLA 5200 uses Coherence Probe Microscopy, a patented white-light interferometric technique.[1]
The KLA 5200 measures surfaces and can measure all layers, including low-contrast or grainy targets.[1]
The KLA 5200 includes built-in analysis software and a graphical user interface.[1]
The following facts about the 5200 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 5200 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 5200 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 5200 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 5200 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 5200 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 10, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.