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Onto Innovation

Nanospec 210

Onto Innovation Nanospec 210 family
Research Quality: 20% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

Onto InnovationNanospec 210
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What is it?

The Nanospec 210 is a thin film measurement system used in semiconductor process control.

What do the numbers mean?

Gas & chemistry1

Film Types Measured
Oxide on Silicon, Nitride on Silicon, Negative Resist on Silicon, Polysilicon on Oxide, Negative Resist on Oxide, Nitride on Oxide, Polyimide on Silicon, Positive Resist on Silicon, Positive Resist on Oxide[1]
Accurate?

Optics & imaging4

Spot Size (5x objective)
50 µm[1]
Accurate?
Spot Size (10x objective)
25 µm[1]
Accurate?
Spot Size (40x objective)
6.5 µm[1]
Accurate?
Resolution
100 angstroms[2]
Accurate?

Configuration & options6

Thickness Range
100 to 500,000 angstroms[1]
Accurate?
Typical Measurement Time
2.5 seconds[1]
Accurate?
Reproducibility
5Å ±5% depending on film type[1]
Accurate?
Reflectance Mode
Thick Films[1]
Accurate?
Manufacturer
Onto Innovation (formerly Nanometrics)[3]
Accurate?
Model
Nanospec 210[3]
Accurate?
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Film Types MeasuredOxide on Silicon, Nitride on Silicon, Negative Resist on Silicon, Polysilicon on Oxide, Negative Resist on Oxide, Nitride on Oxide, Polyimide on Silicon, Positive Resist on Silicon, Positive Resist on Oxide[1]

Where are the manuals?

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Not publicly documented

Field notes

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Not publicly documented

The following facts about the Nanospec 210 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Nanospec 210 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Nanospec 210 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Nanospec 210 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Nanospec 210 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Nanospec 210 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]tech-semi.comtech-semi.com
  2. [2]jmind.comjmind.com
  3. [3]Equipment inventory listing
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Last updated Sep 29, 2026.

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