Thermo Fisher
Scientific FEI NanoLab 450 F 1 FIB-SEM
Power
230V, 50/60Hz[1]
Vacuum
Edwards nXDS10i Vacuum Pump[1]
Optics
SE Detector R 580 p/n 4022 293 43761[1]
What it is
The Thermo Fisher Scientific / FEI NanoLab 450 F 1 is a dual-beam FIB-SEM (Focused Ion Beam - Scanning Electron Microscope) system.[1]
How it works
A rotary probe shaft (part number 1002428) and EasyLift Nanomanipulator enable in situ sample manipulation, such as lift-out for transmission electron microscopy sample preparation.[1]
Where it fits in the process flow
General reference — not yet source-verifiedFIB-SEM systems are used for sample preparation, cross-sectioning, and in situ analysis, commonly positioned after wafer fabrication or failure analysis to examine device structures.
Upstream processes include wafer thinning, defect localization, and mechanical cleaving; downstream analysis includes scanning electron microscopy, energy-dispersive X-ray spectroscopy, and transmission electron microscopy.
Applications
General reference — not yet source-verifiedAdditional applications include materials science characterization, nanoscale prototyping, and imaging of biological samples when prepared for vacuum.
What do the numbers mean?
Power & electrical5
Vacuum & pumping1
- Edwards nXDS10i Vacuum Pump[1]
Gas & chemistry2
- MGIS Multiple Gas Injection system p/n 1060928 rev D[1]
Optics & imaging4
Control & software1
- Dual Control PCs[1]
Configuration & options18
- Dual Beam[1]
- P/N 1032007[1]
- 6-ch BSD Amplifier MK3.1 p/n 1027639[1]
- 150um Plasma Cleaner Unit LP p/n 1032272[1]
- Rotary Probe Shaft p/n 1002428[1]
- EasyLift Nanomanipulator[1]
- Spellman EBM 30N6/636 Triode Supply[1]
- Haskris HB27916 Recirculating Chiller[1]
- OneAC CS2248 Power Conditioner[1]
- Workstation w/ 4ea Acer LCD Monitors[1]
- Sample Holders & Fixtures[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Voltage230V, 50/60Hz[1]
- ConfigurationMGIS Multiple Gas Injection system p/n 1060928 rev D[1]
- ConfigurationControl Cabinet w/ PBF PRA700 Power Supply[1]
- ConfigurationPBF PRA162A Power Supply[1]
- ConfigurationSpellman DPL72I30/24 Power Supply[1]
- ConfigurationEdwards nXDS10i Vacuum Pump[1]
- Power requirement230V, 50/60Hz[1]
- Gas injection systemMGIS Multiple Gas Injection system p/n 1060928 rev D[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What is the model designation of this FIB-SEM?
The model is the Thermo Fisher Scientific / FEI NanoLab 450 F 1.[1]
Is this a dual-beam system?
Yes, the NanoLab 450 F 1 is a dual-beam FIB-SEM, combining a focused ion beam and a scanning electron microscope.[1]
What electron column is installed on this system?
The system uses the Elstar-UC Mk2+iC Electron Column, part number 1044651.[1]
Does the system have a gas injection system?
Yes, it includes a Multiple Gas Injection System (MGIS) with part number 1060928 rev D.[1]
Is a nanomanipulator included?
Yes, the system has a rotary probe shaft and an EasyLift Nanomanipulator for in situ sample handling.[1]
Not publicly documented
The following facts about the Scientific FEI NanoLab 450 F 1 FIB-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Scientific FEI NanoLab 450 F 1 FIB-SEM are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Scientific FEI NanoLab 450 F 1 FIB-SEM are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Scientific FEI NanoLab 450 F 1 FIB-SEM are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Scientific FEI NanoLab 450 F 1 FIB-SEM are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Scientific FEI NanoLab 450 F 1 FIB-SEM is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (1)Every fact above is drawn from these public sources
- [1]Inventory photo
Last updated Oct 11, 2026.
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