YXLON
WI26
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
General reference — not yet source-verifiedThe YXLON WI26 is a real-time X-ray inspection system designed for the non-destructive testing of wheels. The system belongs to a class of dedicated wheel inspection machines used in automotive manufacturing. The model designation WI26 reflects its orientation toward wheel inspection.
How it works
General reference — not yet source-verifiedReal-time wheel inspection systems use X-ray sources and detectors to capture live images of a wheel as it rotates or moves through the beam. The system typically employs automatic defect recognition software to identify flaws without operator intervention. The inspection process involves splitting the X-ray image into regions of interest for precise defect analysis. The imaging chain provides continuous feedback to a control station.
What do the numbers mean?
Configuration & options4
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What are the key factors influencing image quality in these machines?General reference — not yet source-verified
Image resolution is primarily determined by the X-ray source focal spot size—smaller spots yield finer feature distinction—and by detector pixel size. Contrast depends on the X-ray spectrum and the use of filters or digital post-processing. System stability, sample handling precision, and the choice of imaging mode (e.g., continuous or pulsed) also affect the final image quality.
Can these systems be used for measurement of internal dimensions?General reference — not yet source-verified
Yes, metrology is a core function. Dedicated software enables calibrated measurements of length, angle, and area within the X-ray image, or across multiple projections for three‑dimensional analysis. The accuracy depends on the calibration procedure and the scale of the measurement relative to the system resolution.
Not publicly documented
The following facts about the WI26 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the WI26 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the WI26 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the WI26 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the WI26 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the WI26 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]web.archive.org — web.archive.orgweb.archive.org
- [2]FeinFocus microfocus X-ray system Y.Cougar - YXLON — web.archive.orgweb.archive.org
- [3]Y.CT Customized - YXLON — web.archive.orgweb.archive.org
Last updated Oct 5, 2026.
Compare with similar tools
View all →The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.
