Test & Probe

The Agilent 11729C Carrier Noise Test Set is an integral part of a phase noise measurement system, capable of up-converting, down-converting, and phase/frequency demodulation.

The Electroglas EG 6000 e is a wafer prober used in semiconductor test and probe applications.

The Keysight MSOX 4154 A is a mixed signal oscilloscope with 1.5 GHz bandwidth, 5 GSa/s sampling rate, and 4 channels.

Keysight / Agilent M 9037 A is a PXIe embedded controller.

The Agilent 16702 B is a tabletop logic analyzer.

The Electroglas 2001 CX Automatic Wafer Prober is an automatic wafer prober designed for wafer test and sort.

The Cascade Microtech FPD 100 Probe Positioners are a model of probe positioners manufactured by Cascade Microtech.

The Keysight N2803A is a 30 GHz probe amplifier from the InfiniiMax III series.

The Multitest InStrip Handler is a semiconductor test handler for strip-based devices.

The Chroma 58212 CLED Mapping Prober is a mapping prober.

Teradyne A 565 Tester is a 3-phase, 380 V tester with source-stated vintages from 1999 to 2006.

The Advantest T 5375 is a memory test system that supports 300mm wafers and operates at a maximum test frequency of 143 MHz / 286 MHz in DDR mode.

The ASM AS 899 is a test and sort machine.

The Keysight E 5080 B Vector Network Analyzer is a test and probe instrument in the Keysight E5080B ENA Series.

The LTX / Credence D 10 is a tester used in semiconductor manufacturing.

The Advantest T5593 is a memory ATE system designed for testing DDR2 SDRAM and other high-speed memory devices, capable of handling up to 256 devices.

The LTX / Credence Fusion MX is a tester system manufactured by LTX/Credence.

The Keysight / Agilent 4062 UX is a parametric tester.

The Teradyne/Eagle ASM 2160 is a final test system for electronic components and printed circuit boards, compatible with the Teradyne Eagle ETS 364 tester.

The Teradyne A 300 is a tester.

The Micro-Vu Excel 664 UC is a Test & Probe coordinate measuring and video measuring machine.

The Advantest MPT 3000 ENV is a Gen 4 tester used for semiconductor testing.

The Cascade Microtech 103-754 is an x-y-z-θ probe positioner used in the HFTL 50-GHz Small-Signal Probe Station.

The MPI TS150 Probe Station is designed for electrical testing on wafers or chips and supports wafers up to 6 inch.

The Teradyne Spectrum 8862 (TSSE) is a combinational in-circuit and functional test system designed to combine both capabilities on a single platform.

The KLA Inspex Eagle Tester is a wafer handling and inspection system with 6-inch chuck and prealigner, 4-inch to 8-inch wafer capability, cassette-to-cassette handling, two ports, and a Zeiss microscope.

The Advantest 93000 PS 800 LTH is a tester with 768 channels.

The PS 1600 Smartscale is a semiconductor test system from Advantest/Agilent/HP/Verigy, introduced in 2012 and including components such as PS 1600 modules, DPS 32, and a Compact Test Head.

The Advantest V 93000 SOC Series is a system-on-chip (SOC) test system with a variety of testhead boards including PS800, Clock, MSDPS, Digital DC/DC, Analog DC/DC, and AV8.

The Teradyne / Nextest Magnum II EV 128 is a tester.

The SUSS PA 200 is a semi-automatic wafer prober for precision semiconductor wafer testing and electrical measurement.

The Cohu / Delta Design 1688 ES Ambient is a test handler for semiconductor testing.

The Multitest 9928 is a handler used in semiconductor test and probe operations.

The Signatone WL-1160 is an RF/microwave probe station designed for high-frequency, high-power, and millimeter-wave applications.

The Advantest T 6581 T Digital Meter is a digital meter manufactured by Advantest.

The SUSS P 8 is a manual probe station prober.

The Advantest M 6242 is a handler for BGA, CSP, and TSOP 1 target packages.

The Micromanipulator 8060 Wafer is a test and probe wafer prober for 8-inch wafers.

The Esec 2008 is a handler manufactured by Esec, listed in the Test & Probe equipment category.

The KLA 4PP-TypeA is a four-point probe.

The Tokyo Electron WDF DP is a wafer prober.

The Cascade Microtech Summit 12000 is a probe station or prober for semiconductor wafer testing.

The Tel P 8 XL Automatic Wafer Prober is an automatic wafer prober manufactured by Tel.

The Tektronix 335 is a lightweight, totally portable oscilloscope from the 300 series, produced under the Sony-Tektronix name.

The Tektronix 8562 was a microprocessor development system, part of the 8540/8550/8560 line, which was the final upgraded variant of that series.

The P 8 XLm is a wafer prober manufactured by Tokyo Electron.

Teradyne's Magnum 7 is a memory test system designed for the testing of memory devices.

The Teradyne IP 750 is a tester.