Waferpedia

Comparison ledger

0010-18024 Pyrometer AssemblyversusM-2000

Applied Materials 0010-18024 Pyrometer Assembly, Woollam M-2000, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
M-2000Woollam
OEMApplied MaterialsWoollam
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0010-18024 Pyrometer AssemblyWoollam M-2000
Specifications
ConfigurationCapable of working on Applied Materials Radiance[1]—
Equipment type—Spectroscopic ellipsometer[2]
Location—SEEL 168 Bay 1[2]
Designed for—Precise characterization of thin films[2]
Measures—Thickness, refractive index, and extinction coefficient[2]
Spectral range—UV to near-infrared[2]
Measurement technology—Rotating compensator technology[2]
Measurement type—Thickness, refractive index, extinction coefficient[2]
Technology—Rotating compensator[2]
Data acquisition—High-speed, high-accuracy[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]colorado.educolorado.edu