Woollam

M-2000

Metrology & Inspection Woollam M-2000 family

Research Quality: 60% complete

LinkedIn X Email

M-2000 — colorado.edu — Fig. 01M-2000colorado.edu^[1]

Plate 01J.A. Woolam M-2000 training video
Eyring Materials CenterWatch on YouTube
Plate 02ASU Core Facilities Equipment Showcase: J.A. Woollam M2000 Spectroscopic Ellipsometer
Arizona State University ResearchWatch on YouTube

What it is

The J.A. Woollam M-2000 is an ellipsometer used in metrology and inspection.^[2]

How it works

General reference — not yet source-verified

An ellipsometer directs polarized light at a sample and measures the change in the reflected or transmitted polarization state.

The measurement response is used to infer film thickness and optical properties in layered materials.

Where it fits in the process flow

General reference — not yet source-verified

The instrument is used after deposition or other film-forming steps to verify film properties before further processing or final evaluation.

Applications

The J.A. Woollam M-2000 is used for thin-film metrology in fabrication environments.^[2]

Thin-film characterization
Complex multilayer stacks
Transparent films
Advanced material research

What do the numbers mean?

Performance1

Data acquisition: High-speed, high-accuracy^[1]

Configuration & options8

Equipment type: Spectroscopic ellipsometer^[1]
Location: SEEL 168 Bay 1^[1]
Designed for: Precise characterization of thin films^[1]
Measures: Thickness, refractive index, and extinction coefficient^[1]
Spectral range: UV to near-infrared^[1]
Measurement technology: Rotating compensator technology^[1]
Measurement type: Thickness, refractive index, extinction coefficient^[1]
Technology: Rotating compensator^[1]

Interested in this tool?

Need help with this tool?Embed spec card

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Worked with this tool? Help preserve its knowledge →

Frequently asked questions

What class of instrument is the J.A. Woollam M-2000?

The J.A. Woollam M-2000 is an ellipsometer.^[2]

Where is the J.A. Woollam M-2000 placed in the facility workflow?

The J.A. Woollam M-2000 is part of the characterization tool set in the fabrication environment.^[2]

Not publicly documented

The following facts about the M-2000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the M-2000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the M-2000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the M-2000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the M-2000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the M-2000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources

[1]colorado.edu — colorado.educolorado.edu
[2]Resource Scheduler & Rates | Colorado Shared Instrumentation in Nanofabrication and Characterization (COSINC) | University of Colorado Boulder — colorado.educolorado.edu
[3]Resource Scheduler & Rates | Colorado Shared Instrumentation in Nanofabrication and Characterization (COSINC) | University of Colorado Boulder — colorado.educolorado.edu