Comparison ledger
Keysight 4142 B, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 4142 BKeysight | 1007KLA |
|---|---|---|
| OEM | Keysight | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight 4142 B | KLA 1007 |
| Specifications | ||
| Architecture | Mainframe with 8 slots for plug-in measurement units[1] | — |
| Integrated measurement functions | Current/voltage sources, nanovoltmeters, and picoammeters in one instrument[1] | — |
| Source Monitor Unit (SMU) sensitivity | Forces voltage while measuring currents down to 20 fA; forces current while monitoring voltages down to 40 µV[1] | — |
| HP 41420A High Power SMU | 2 slots; 40 µV to 200 V, 20 fA to 1 A (±200 V and ±1 A)[1] | — |
| HP 41421B Medium Power SMU | 1 slot; 40 µV to 100 V, 20 fA to 100 mA (±100 V and ±100 mA)[1] | — |
| HP 41422A High Current Unit (HCU) | 2 slots; pulse mode only; 100 µs pulsed measurements up to ±10 V and 10 A[1] | — |
| HP 41423A High Voltage Unit (HVU) | 2 slots; DC or pulsed measurements to ±1000 V; low-leakage design measures currents down to 2 pA[1] | — |
| HP 41425A Analog Feedback Unit (AFU) | 1 slot; used with two SMUs for analog voltage/current searches; finds target values in 12 ms[1] | — |
| Maximum configuration coverage | 2000 V max using two HVUs; 20 A (pulsed) using two HCUs[1] | — |
| Maximum output power | Sum of all measurement units' instantaneous output power cannot exceed 32 W[1] | — |
| Maximum common-to-ground voltage | ±42 V[1] | — |
| Ground Unit (GNDU) | High-current SMU set to 0 V, used as measurement ground; Kelvin connection; maximum offset voltage ±500 µV; current range ±1.6 A[1] | — |
| Program memory | Approx. 2000 program steps, groupable into 99 subroutines[1] | — |
| Data memory | Maximum 4095 data values (binary) or 1023 data values (ASCII)[1] | — |
| Measurement modes | Plug-in units operate individually or in synchronized modes to perform ten different types of measurements[1] | — |
| Interfaces | HP-IB; external trigger input (TTL, negative logic, minimum pulse width 100 µs); external trigger output (TTL, negative logic)[1] | — |
| Self-test and calibration | Self-test at power-up; offset errors in each measurement unit auto-calibrated every 30 minutes[1] | — |
| Operating temperature | 5 °C to 40 °C[1] | — |
| Operating humidity | 5% to 80% RH[1] | — |
| Storage temperature and humidity | -40 °C to 65 °C; <90% RH at 65 °C[1] | — |
| Power requirements | 100/120/220 V ±10%; 240 V -10%/+5%; maximum 750 VA (48-66 Hz)[1] | — |
| Dimensions | 426 mm W × 235 mm H × 676 mm D[1] | — |
| Weight | Mainframe approx. 23 kg; plug-in units 2-3 kg each[1] | — |
| Typical measurement time (SMU) | HP 41420A/HP 41421B SMU (20 V/100 mA range, spot measurement): force I or V in 3.5 ms; measure I or V in 4.0 ms[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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