Comparison ledger
Filmetrics F20, Perkin Elmer 1050 UV-VIS, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | F20Filmetrics | 1050 UV-VISPerkin Elmer |
|---|---|---|
| OEM | Filmetrics | Perkin Elmer |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Filmetrics F20 | Perkin Elmer 1050 UV-VIS |
| Cited variants | — | |
| Specifications | ||
| Measurement technique | reflectance / optical reflectometry[2] | — |
| Primary measurement | film thickness[2] | — |
| Materials measured | dielectrics, semiconductors, and thin metals[2] | — |
| Spot size | large spot[2] | — |
| Optical model | multilayer optical models[2] | — |
| General use description | general purpose film-measurement instrument[1] | — |
| Wavelength range (F20-EXR variant mentioned in source) | 400-1700 nm[1] | — |
| Technique | Optical reflectometry (spectral reflectance)[3] | — |
| Measurement | Film thickness and refractive index (n & k)[2] | — |
| Beam size (ASU configuration) | Large spot[2] | — |
| Beam size (Utah configuration) | Small spot[4] | — |
| Analysis | Multilayer optical models[2] | — |
| Wavelength range (F20-EXR variant) | 400–1700 nm[1] | — |
| Asset ID | — | 82948[5] |
| Last Confirm Date | — | August 23, 2024[5] |
| Manufacturer | — | Perkin Elmer[5] |
| Model | — | 1050[5] |
| Instrument type | — | Spectrometer[5] |
| Use | — | Analyzing ultraviolet and visible light absorption spectra[5] |
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