Comparison ledger
KLA .496 PSL Wafer, Koh Young KY 8030 3D, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | KY 8030 3DKoh Young | |
|---|---|---|
| OEM | KLA | Koh Young |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .496 PSL Wafer | Koh Young KY 8030 3D |
| Cited variants | — | |
| Specifications | ||
| Configuration | NIST Traceable[2] | — |
| Wafer size | 8 inch[2] | — |
| Traceability | NIST Traceable[2] | — |
| Compatible systems | Capable on Surfscan 6xy0 and SP1[2] | — |
| Category | Metrology & Inspection[3] | — |
| Inspection Speed (KY8030-2) | — | 11.1 to 59.5 cm²/sec[1] |
| Max Paste Height (KY8030-2) | — | 450 microns[1] |
| Resolutions (KY8030-2) | — | 10, 15, 20 or 25 microns[1] |
| Inspection Speed (KY8030-3) | — | 81.85 cm²/sec at 8 megapixel and 20 microns[1] |
| Max Inspection Height (KY8030-3) | — | 400 microns[1] |
| Max Board Length (USX) | — | 1,300 millimetres[1] |
| Base Model | — | KY 8030[4] |
| Vintage | — | 2011[4] |
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