Tool family
The Advantest 93000 is a tester with listed dedicated, infrastructure, digital, and DC components.
The Advantest 93000 C 200 E is a semiconductor tester.
The Advantest 93000 PS 1600 CTH is a tester in the Test & Probe category.
The Advantest 93000 PS 400 is a tester with a large test head and four PS 400 channel cards.
The Advantest 93000 PS 400 ATE is an automatic test equipment system in the Test & Probe category.
The Advantest 93000 PS 800 Tester is a tester identified with pin count, MSDPS, DC/DC, AC/DC, and manipulator details.
The Advantest 93000 PS 800 LTH is a tester with 768 channels.
The Advantest 93000 Smart Scale Tester is a semiconductor test system that includes a Z640 workstation and can be configured with STH or CTH thermal heads and various card types.
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
Cited variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Advantest 93000 SOC Tester | — | — | Sources show differing installed module configurations, including dedicated, AC, infra, digital, and DC sections. | Equipment inventory listing[1] |
The Advantest 93000 is a tester with listed dedicated, infrastructure, digital, and DC components.
The Advantest 93000 C 200 E is a semiconductor tester.
The Advantest 93000 PS 1600 CTH is a tester in the Test & Probe category.
The Advantest 93000 PS 400 is a tester with a large test head and four PS 400 channel cards.
The Advantest 93000 PS 400 ATE is an automatic test equipment system in the Test & Probe category.
The Advantest 93000 PS 800 Tester is a tester identified with pin count, MSDPS, DC/DC, AC/DC, and manipulator details.
The Advantest 93000 PS 800 LTH is a tester with 768 channels.
The Advantest 93000 Smart Scale Tester is a semiconductor test system that includes a Z640 workstation and can be configured with STH or CTH thermal heads and various card types.
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.