Advantest
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Advantest M6542AD is a pick & place memory handler. The Advantest M6542AD has a temperature capability of -55°C to 130°C. The Advantest M6542AD includes a -55°C low temperature kit as an option.[1][2][3]
Test handlers are automated machines used in semiconductor final test to transfer devices between input media and a test head, and then sort them into output bins based on test results. The pick-and-place mechanism uses vacuum pickup tools to move individual devices.
The M6542AD is a memory handler, used for testing packaged memory devices.[1]
How individual machines were equipped when they appeared on the secondary market — as listed, per unit. These describe one specific machine, not the model in general.
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| M6542AD+ATIE1 | — | — | Recommended pack includes a device cooling unit, contact attachment for 32/64/128 site, system software, signal tower, LN2 valve, cooling LN2 valve, stocker, -55 C low temperature kit, air flow meter, handler synchronization kit, ionizer kit, and test head positioner. | jadgrp.com[3] |
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The handler moves devices through a temperature-conditioning chamber or soak zone, where they are held for sufficient time to reach thermal equilibrium. The cold option supplies chilled air or equivalent cooling to maintain that desired low temperature until the moment of test contact.
Test handlers of this class are generally designed for packaged semiconductor devices, including integrated circuits and discrete devices, that fit within the handler's input media and socket configuration. The cold option is especially relevant for devices whose cold-temperature operation must be verified.
After the tester evaluates each device, the handler receives the result and mechanically transfers the device to a corresponding output bin. Bins are used to separate passing devices, failing devices, and devices with different measured performance levels.
The following facts about the M6542AD TEST HANDLER WITH COLD OPTION are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the M6542AD TEST HANDLER WITH COLD OPTION are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the M6542AD TEST HANDLER WITH COLD OPTION are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the M6542AD TEST HANDLER WITH COLD OPTION are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the M6542AD TEST HANDLER WITH COLD OPTION is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the M6542AD TEST HANDLER WITH COLD OPTION are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Last updated Oct 9, 2026.
The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.