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Bruker

Dimension 3100

Metrology & InspectionBruker Dimension family
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Dimension 3100 — Inventory photo
Fig. 01Dimension 3100Inventory photo[1]

What it is

The Dimension 3100 is an atomic force microscope (AFM) produced jointly by Bruker and Veeco.[1][6][2]

How it works

General reference — not yet source-verified

An AFM operates by raster-scanning a sharp tip mounted on a flexible cantilever across the sample surface while a feedback loop maintains constant tip-sample interaction, typically constant force in contact mode or constant oscillation amplitude in tapping mode.

The deflection of the cantilever is measured using a laser beam reflected off the cantilever onto a photodetector, producing a three-dimensional topographic map of the surface.

Where it fits in the process flow

General reference — not yet source-verified

Atomic force microscopes are used in semiconductor fabrication for offline or inline metrology, providing high-resolution measurements of surface roughness, step heights, line widths, and other topographical features at the nanoscale.

Applications

The Dimension 3100 supports multiple imaging modes including conductive AFM (CAFM) and extended tunneling AFM (TUNA) through dedicated application modules.[2]

What do the numbers mean?

Vacuum & pumping1

Associated MasterFlex L/S Peristaltic Pump[2]
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Wafer handling2

Wafer Size
8 inch[1]
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Wafer sizes
8 inch[1]
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Control & software10

Nanoscope IV Controller[1]
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Upgraded AFM Control Computer with NanoScope V 6.13 Control Software[2]
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NanoScope IV Scanning Probe Microscope Controller[2]
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NanoScope Dimension 3100 Stage Controller[2]
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Thermal Applications Controller (TAC)[2]
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Controller
Nanoscope IV[1]
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Control Software
NanoScope V 6.13[2]
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Analysis Software
NanoScope Analysis V 1.5[2]
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Thermal Applications Controller
TAC[2]
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Controller
Nanoscope IV Controller[1]
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Dimensions & facilities2

3 Dimension Series AFM Heads (Standard Open Loop XYZ, Closed Loop XY / Open Loop Z and Hybrid Closed Loop XYZ)[2]
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Model
Dimension 3100[1]
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Configuration & options22

Comes with all necessary components[2]
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Including:[2]
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NanoScope Analysis V 1.5[2]
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Dual 22" Dell Flatscreen Monitors[2]
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Digital instruments Trackball[2]
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Keyboard & Mouse[2]
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TMC Gimbal Piston Pneumatic Vibration Isolation Table and Acoustic Enclosure / Hood[2]
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Probe Mounting Block[2]
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Variety of Probe Holders and Fluid Splash Guards (inquire for more details)[2]
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CAFM and Extended TUNA Application Modules[2]
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Temperature
2 Non-magnetic Heater / Cooler Stages (-35° to +100°C[2]
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Several Boxes of Harmonix AFM probes[2]
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Variety of Miscellaneous Spare Cables[2]
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Hardware Parts[2]
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Vintage
2002[1]
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Monitors
Dual 22" Dell Flatscreen Monitors[2]
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Vibration Isolation
TMC Gimbal Piston Pneumatic Vibration Isolation Table with Acoustic Enclosure[2]
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AFM Heads
Standard open-loop XYZ, closed-loop XY/open-loop Z, hybrid closed-loop XYZ[2]
Accurate?
Application Modules
CAFM and Extended TUNA[2]
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Heater/Cooler Stages
Two non-magnetic stages, -35° to +100°C[2]
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OEM
Bruker / Veeco[1]
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Tool type
AFM (Atomic Force Microscope)[1]
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • ConfigurationAssociated MasterFlex L/S Peristaltic Pump[2]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What controller is used with the Dimension 3100?

The Dimension 3100 is typically equipped with a Nanoscope IV controller.[1][2]

Who manufactured the Dimension 3100?

The Dimension 3100 is an atomic force microscope from Bruker / Veeco.[1][6][2]

Not publicly documented

The following facts about the Dimension 3100 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Dimension 3100 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Dimension 3100 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Dimension 3100 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Dimension 3100 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Dimension 3100 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (7)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]Inventory photo
  3. [3]Inventory photo
  4. [4]Inventory photo
  5. [5]Inventory photo
  6. [6]Equipment inventory listing
  7. [7]Facilities | Center for Materials, Devices, and Integrated Systems — cmdis.rpi.educmdis.rpi.edu
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Last updated Oct 3, 2026.

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