Bruker

The Bruker/Veeco 5000 is an atomic force microscope (AFM) manufactured by Bruker (formerly Veeco).

The Bruker B H 15 Controller is a Bruker controller identified by model B H 15.

The Bruker InSight 3 DAFM Photomask Atomic Force Microscope is a photomask atomic force microscope designed for 12-inch wafers.

The Bruker / Veeco Dektak XT is a profilometer with a 4-inch stage, software-controlled movement, a 12.5-micron stylus diameter, and an included enclosure.

The Bruker Dimension 340 is an atomic force microscope (AFM) originally introduced as a Veeco system.

The Bruker Dimension 2D is an atomic force microscope (AFM) that combines Bruker's proven, industry-leading AFM platforms with a curated suite of highest-priority modes and capabilities to meet the critical requirements of modern 2D materials research.

The Bruker Dektak 6 M Surface is a contact stylus surface profilometer for measuring thin-film thickness and surface features.

The Bruker DI Innova is an atomic force microscope (AFM) marketed as 'Metrology & Inspection' equipment.

The Dektak150 is an advanced surface texture measuring system which accurately measures surface texture below submicro-inch and film thickness to 1000μm.

The Bruker HFX 90 is an NMR spectroscopy system that was the first NMR system to use only semiconductor transistors and featured three independent channels.

The Bruker Contour R1 is a 3D optical metrology system used for non-contact surface characterization.

The Bruker JV QC 3 is an X-ray diffractometer (XRD) placed in the Metrology & Inspection equipment category.

The Bruker Contour GTX is a white light interferometer (WLI) used for optical surface metrology.

Bruker maXis plus Mass is a Precision Optics tool documented with a KdScientific syringe pump, an Agilent G 3199 B vacuum pump, and an HP Z440 PC with an HP Elite Display E242 monitor.

The Bruker QC 3 is an X-ray diffractometer (XRD) used for metrology and inspection.

The Bruker / Veeco Dimension 9000 M is an atomic force microscope (AFM) for metrology and inspection that handles 6-inch wafers.

The Dektak 3030 Surface Profiler is a stylus-based surface profiling instrument originally marketed by Sloan and later by Veeco and Bruker.

The Bruker D 8 Advance is an X-ray diffractometer for XRD, PDF, SAXS, and WAXS applications.

Bruker Dimension Edge is an atomic force microscope (AFM) used for nanoscale surface topography and nanomechanical measurements.

The Bruker Dimension 7000 is an atomic force microscope used for metrology and inspection of 8-inch wafers.

The Bruker Dimension 8000 is an atomic force microscope in the Metrology & Inspection category.

The Bruker BFX 5 is an RF generator.

The Bruker D 8 Advance Powder is a powder X-ray diffractometer (XRD).

The Jordan Valley JVX 6200 is an X-ray metrology tool used for semiconductor wafer measurement.

Bruker / Jordan Valley JVX 5200 T is a metal film thickness measurement system described as a fluorescent XRA frame from 2004.

The Bruker Avance III HD+ Ascend 600 is a nuclear magnetic resonance (NMR) spectrometer.

Bruker DAFP is an AFM probe for atomic force microscope applications. Bruker DAFP is categorized as a Metrology & Inspection tool.

The Bruker / Veeco Dimension 3100 is an atomic force microscope (AFM) used for surface topography measurement on wafers up to 8 inches.

The Bruker D 8 Fabline is a fully automated X-ray diffractometer configured with wafer chuck and standard sample holder support.

The Bruker Dimension Icon is a large-sample atomic force microscope designed for high-resolution nanoscale imaging and measurement.

Bruker Dimension X 3 D 340 is an atomic force microscope introduced in 2004.

The Dimension 5000 is an atomic force microscope (AFM) for metrology and inspection, supporting samples up to 300 mm diameter.

The Bruker Contour GTK Optical is an optical microscope manufactured by Bruker, categorized under metrology and inspection.

The Bruker NT 9100 Automatic Desktop Optical is an automatic desktop optical profilometer. The Bruker NT 9100 Automatic Desktop Optical is categorized as metrology and inspection equipment.

The Bruker D 8 Discover Analytical is an X-ray diffractometer.

The Bruker SNL 10 is a wafer prober used in semiconductor test and measurement.

The Bruker / Veeco Dektak 150 is a contact stylus surface profiler designed for two-dimensional surface profile measurements in industrial and research applications.

The Bruker D6 Phaser is an X-ray diffractometer (XRD) instrument listed in the Harvard CNS rate sheet.

The Bruker Dektak 400 Stylus is a stylus profilometer used for metrology and inspection.

The Bruker Dektak 8 is a contact profilometer capable of measuring vertical steps from tens of nanometers to 1mm in depth, with scan lengths up to 50mm, and can accommodate samples as large as 8-inch wafers.

The Bruker B EC 1 is a cabinet that includes a MENG AT26152A 22 kVA 3-phase autotransformer.

The Bruker MESP RC V 2 is an AFM probe (Atomic Force Microscope) with a rectangular geometry, available in a box of 10.

The Bruker / Veeco Dimension Fastscan is an atomic force microscope with stated scan, noise, stage, optics, software, and AFM mode specifications.

The Bruker 300 NMR Spectroscopy is a nuclear magnetic resonance spectrometer manufactured by Bruker.

The Bruker Rtespa 300 is a test and probe tool categorized under Test & Probe equipment.