Waferpedia

Dektak

6M

Wet Processing / Clean6"Dektak 6M family
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The Dektak 6M Stylus Profilometer is a film step-height measurement tool capable of measuring steps from 260 microns down to 10 nm. The Dektak 6M is equipped with a 25-micron-radius, high-aspect-ratio stylus. The Dektak 6M has a maximum acceptable sample size of 6 inches.[1]

Dektak6M
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Wafer size

6"

Optics

Steps from 260 microns down to 10 nm[1]

What it is

The Dektak 6M is a stylus profilometer used for surface metrology in a cleanroom environment. The instrument is classified as cleanroom instrumentation and as a surface analysis tool. The Dektak 6M is a film step-height measurement tool capable of measuring steps from 260 microns down to 10 nm.[1][2]

The system can also be used to profile surface topography and measure surface roughness in the nanometer range. The system is currently equipped with a 25-micron-radius, high-aspect-ratio stylus. Maximum acceptable sample size is 6 inches.[1]

How it works

General reference — not yet source-verified

Stylus profilometers operate by bringing a mechanical stylus into contact with the sample surface and translating the sample or the stylus across a programmed scan length. The vertical motion of the stylus as it follows the surface is converted into a height profile, which is used to determine step heights, roughness parameters, and general topography.

Applications

General reference — not yet source-verified

Stylus profilometry of this class is commonly applied to characterize photoresist steps, deposited metal and dielectric films, etched trenches, and other surface features produced during nanofabrication. The technique provides a direct contact-based measurement of vertical dimensions across a line scan.

  • Film step-height measurement
  • Surface topography profiling
  • Surface roughness measurement

What do the numbers mean?

Optics & imaging2

Measurement range
Steps from 260 microns down to 10 nm[1]
Accurate?
Step height measurement range
260 µm to 10 nm[1]
Accurate?

Dimensions & facilities1

Measured feature
Film step height[1]
Accurate?

Configuration & options9

Instrument type
Stylus profilometer[1]
Accurate?
Equipment type
Cleanroom Instrumentation; Metrology; Microscopy/Surface Analysis; Surface Analysis[1]
Accurate?
Additional uses
Surface topography profiling and surface roughness measurement in the nanometer range[1]
Accurate?
Stylus radius
25-micron radius high aspect ratio stylus[1]
Accurate?
Maximum acceptable sample size
6 inches[1]
Accurate?
Location
FNT 4.106[1]
Accurate?
Contact
Dr. Raluca Gearba[1]
Accurate?
Stylus radius
25 µm[1]
Accurate?
Maximum sample size
6 inches[1]
Accurate?
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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What types of chemicals are typically used in wet processing equipment?General reference — not yet source-verified

Common chemicals include acids, bases, solvents, and etchants such as hydrofluoric acid, sulfuric acid, ammonium hydroxide, and isopropyl alcohol. Deionized water is used for rinsing.

How are substrates handled in wet processing tools?General reference — not yet source-verified

Substrates are typically handled by robotic arms or conveyor systems, often in cassettes or carriers. The equipment maintains cleanliness through filtered fluids, sealed chambers, and controlled environments to minimize particle contamination.

What are the key process parameters to control in wet processing?General reference — not yet source-verified

Important parameters include chemical concentration, temperature, immersion time, agitation, and rinse quality. Consistent control ensures uniform etching and effective cleaning.

Not publicly documented

The following facts about the 6M are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 6M are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 6M are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 6M are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 6M are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 6M is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]tmi.utexas.edu — tmi.utexas.edutmi.utexas.edu
  2. [2]Instrumentation — tmi.utexas.edutmi.utexas.edu
  3. [3]Instrumentation — tmi.utexas.edutmi.utexas.edu
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Last updated Oct 3, 2026.

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