KLA
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The Candela CS 10 is used in semiconductor manufacturing environments for inspection of wafers and other substrates.[4]
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Candela CS10/CS20 | — | — | The source groups CS10 and CS20 as related models and states manual operation for CS10 and automated transport for CS20. | instrumenthive.com[4] |
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The Candela CS 10 inspects bare and patterned wafers, compound semiconductor substrates such as GaAs, SiC, and GaN, and transparent materials such as quartz, sapphire, and fused silica.[4]
The Candela CS 10 targets particles, residue, scratches, digs, pits, and topographic variations.[4]
The following facts about the Candela CS 10 Surface are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Candela CS 10 Surface are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the Candela CS 10 Surface are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Candela CS 10 Surface are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Candela CS 10 Surface is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Candela CS 10 Surface are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Oct 11, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.