Waferpedia

LTX-Credence

Quartet

Test & ProbeLTX-Credence Quartet family
Research Quality: 30% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The LTX-Credence Quartet is a mixed-signal tester for semiconductor testing.[1]

LTX-CredenceQuartet
No photo available yet

What it is

The LTX-Credence Quartet is a mixed-signal tester in the test and probe category.[1]

The Quartet is a test and probe instrument associated with LTX-Credence.[3][4]

How it works

General reference — not yet source-verified

A test and probe system brings probes into contact with pads or other contact sites on a wafer so electrical signals can be applied and measured on individual devices.

A mixed-signal tester can support both analog and digital characterization in the same platform, which makes the class suitable for devices that combine different signal domains.

Where it fits in the process flow

General reference — not yet source-verified

A test and probe platform is typically used after front-end device fabrication and before downstream packaging or final product test.

Applications

General reference — not yet source-verified

The mixed-signal tester class is used for devices that require both analog and digital measurement coverage.

What do the numbers mean?

No specifications recorded yet

Be the first to add cited specifications for this tool.

Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
Quartet One Plus———waferpedia.com[2]
Interested in this tool?
Need help with this tool?Embed spec card

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Worked with this tool? Help preserve its knowledge →

Frequently asked questions

What is the Quartet classified as?

The Quartet is classified as a mixed-signal tester in the test and probe category.[1]

What process category does the Quartet belong to?

The Quartet belongs to the test and probe process category.[3][4][1]

Not publicly documented

The following facts about the Quartet are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No specifications for the Quartet are on record.

    Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Quartet are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the Quartet are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Quartet are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Quartet is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (4)Every fact above is drawn from these public sources
  1. [1]LTX / Credence Quartet | SPS Global — semi-sps.comsemi-sps.com
  2. [2]waferpedia.com — waferpedia.comwaferpedia.com
  3. [3]Equipment inventory listing
  4. [4]Quartet — LTX-Credence | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Was this page accurate?

Last updated Oct 2, 2026.

Compare with similar tools

View all →