Teradyne
J 750
Plate 01Test Program Generation for J750 CC - PC Screen capture.
KF KwokWatch on YouTube
Power
3 Phase[3]
Control era
Windows XP SP3
What it is
How it works
A probe station moves a wafer so each integrated circuit can be aligned for electrical contact and test.[15]
A probe card on the probe station carries several hundred needles that contact pads on the integrated circuit under test.[15]
The tester transmits electrical signals to the integrated circuit and analyzes the responses.[15]
The J 750 test head is connected to the probe station through docking hardware and a pogo tower in wafer probing applications.[15]
Where it fits in the process flow
The same tester can also be used after packaging in a handler-based test setup.[15]
Applications
What do the numbers mean?
Vintage & configurations
Control-system eraWindows XP SP3[1]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest HP / Verigy PS 1600 Smartscale— Same function class: Test & Probe, UnknownCompare in depthsource[16]
- Advantest HP / Verigy PS 3600 Pinscale— Same function class: Test & Probe, UnknownCompare in depthsource[17]
- Advantest 93000— Same function class: Test & Probe, UnknownCompare in depthsource[18]
- Advantest V 93000— Same function class: Test & Probe, UnknownCompare in depthsource[19]
- LTX-Credence TMT ASL 1000 165— Same function class: Test & Probe, UnknownCompare in depthsource[20]
- Eagle ETS 200 T— Same function class: Test & Probe, UnknownCompare in depthsource[21]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
- Teradyne J 750 ICUD BoardIn Productionsource[22]
- Teradyne J 750 HSD 800 BoardIn Productionsource[23]
- Teradyne J 750 DPS BoardIn Productionsource[24]
- Teradyne J 750 DPS BoardIn Productionsource[25]
- Teradyne J 750 BoardIn Productionsource[26]
- Teradyne J 750 DSMTO (HSD 200) 239-701-00 BoardIn Productionsource[27]
- Teradyne J 750 DSIO BoardIn Productionsource[28]
- Teradyne J 750 BoardIn Productionsource[29]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What is the Teradyne J 750 used for?
The Teradyne J 750 is a semiconductor test system used for testing integrated circuits, including wafer-form testing at a probe station.[2][15]
How does the J 750 connect to a probe station?
The J 750 connects to a probe station through a test head and a pogo tower that contacts the tester and the probe card.[15]
What happens at the wafer during J 750 probe testing?
The probe station aligns the wafer, the probe card touches the pads on the integrated circuit, and the tester sends signals and analyzes the responses.[15]
Can the J 750 be used after wafer probe?
The J 750 can also be used during handler-based testing after the wafer is cut and the individual integrated circuits are packaged.[15]
Not publicly documented
The following facts about the J 750 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the J 750 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the J 750 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
No publicly documented failure modes or field errata for the J 750 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the J 750 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly hosted manuals, SOPs, or datasheets for the J 750 are on record.
Answerable by: university cleanroom staff or an OEM application specialist
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (32)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]Inventory photo
- [6]Inventory photo
- [7]Inventory photo
- [8]Inventory photo
- [9]Inventory photo
- [10]Inventory photo
- [11]Inventory photo
- [12]Inventory photo
- [13]inventory listing
- [14]inventory listing
- [15]patents.google.com — patents.google.compatents.google.com
- [16]Equipment inventory listing
- [17]Equipment inventory listing
- [18]Equipment inventory listing
- [19]Equipment inventory listing
- [20]Equipment inventory listing
- [21]Equipment inventory listing
- [22]Equipment inventory listing
- [23]Equipment inventory listing
- [24]Equipment inventory listing
- [25]Equipment inventory listing
- [26]Equipment inventory listing
- [27]Equipment inventory listing
- [28]Equipment inventory listing
- [29]Equipment inventory listing
- [30]US6466007B1 - Test system for smart card and indentification devices and the like - Google Patents — patents.google.compatents.google.com
- [31]Equipment inventory listing
- [32]Teradyne - Divisions Contact Information — teradyne.com (Feb 10, 2014)web.archive.org
Last updated Oct 6, 2026.
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