J 750 EX HD

The J 750 EX HD belongs to the class of automatic test equipment used to test integrated circuits. Testers of this class verify the electrical behavior of semiconductor devices during production. A system of this kind forms a test cell together with a prober or handler, a manipulator, and a host workstation.

Semiconductor testers apply electrical stimulus to the pins of a device under test and compare the device's responses with expected values. The test head carries the interface electronics and docks to a wafer prober or a device handler. A host workstation runs the test program and reports pass or fail results. Device power supplies and pin electronics generate the voltages, timing, and digital patterns used during testing.

Programs for testers of this class are written in the tester's native test language and executed on the host. The same test program can be used for engineering characterization and for high-volume production testing.

Semiconductor testers operate at two points in the integrated-circuit manufacturing flow. Wafer probe testing verifies individual die while they are still on the wafer. Final test verifies devices after packaging. Testers of this class are applied at both steps, depending on the configuration of the test cell.