Teradyne
The Teradyne / Nextest Magnum 2 EV is an automated memory tester. The Teradyne / Nextest Magnum 2 EV supports 12 inch wafers.[1][2]

A memory tester applies automated electrical test patterns to memory devices and measures their responses.
A wafer test and probe setup contacts devices at wafer level so individual die can be checked before later assembly steps.
The machine supports screening of memory devices before downstream assembly and final test.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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The following facts about the Nextest Magnum 2 EV Automated Memory are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Nextest Magnum 2 EV Automated Memory are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Nextest Magnum 2 EV Automated Memory are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Nextest Magnum 2 EV Automated Memory are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Nextest Magnum 2 EV Automated Memory are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Nextest Magnum 2 EV Automated Memory is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 11, 2026.
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