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STS

310

Deposition100mmSTS 310 family
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The STS 310 is a plasma-enhanced chemical-vapor-deposition system. The STS 310 was used to deposit silicon dioxide. The STS 310 was used to deposit silicon nitride.[1]

STS310
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Wafer size

100mm

Vacuum

650 mtorr[1]

Gas delivery

Increase 2% SiH4/Ar flow to 500 sccm[1]

What it is

General reference — not yet source-verified

The STS 310 is a deposition system designed for thin film growth in semiconductor and microelectromechanical systems fabrication. The tool belongs to a class of plasma-enhanced chemical vapor deposition equipment that operates at reduced temperatures compared to thermal CVD. The STS 310 is used to deposit dielectric films such as silicon dioxide and silicon nitride on silicon wafers.

How it works

General reference — not yet source-verified

The STS 310 deposits thin films using a plasma-enhanced chemical vapor deposition process. Precursor gases are introduced into a vacuum chamber and a radio-frequency plasma is ignited above the substrate. The plasma dissociates the precursor molecules into reactive radicals that adsorb onto the wafer surface and react to form a solid film. The substrate is typically heated to a controlled temperature to promote surface reactions and film densification without requiring the high temperatures of thermal CVD.

Where it fits in the process flow

General reference — not yet source-verified

The STS 310 is positioned in the fabrication sequence after cleaning steps and before photolithography or etching. The deposited films serve as insulating layers, passivation coatings, or hard masks for subsequent processes. The tool is used in both front-end-of-line and back-end-of-line processing where low-temperature deposition of high-quality dielectrics is required.

Applications

General reference — not yet source-verified

The STS 310 is used to deposit dielectric thin films for MEMS devices, integrated circuits, and optoelectronic components. Common deposited materials include silicon dioxide, silicon nitride, and silicon oxynitride. The films provide electrical insulation, mechanical protection, and chemical barriers in multilayer device stacks.

  • deposition of silicon dioxide films
  • deposition of silicon nitride films

What do the numbers mean?

Power & electrical2

Oxide Recipe Details
2% SiH4 in Ar at 400 sccm, N2O at 900 sccm, 60 W at 13.56 MHz, 650 mtorr, 300 °C[1]
Accurate?
Nitride Recipe (Low RI) Details
2% SiH4 in Ar at 200 sccm, N2 at 2000 sccm, power alternating between 30 W at 13.56 MHz for 6 s and 25 W at 187 kHz for 3 s, 650 mtorr, 300 °C[1]
Accurate?

Vacuum & pumping1

Pressure
650 mtorr[1]
Accurate?

Wafer handling2

Wafer size
100-mm-diameter silicon wafers[1]
Accurate?
Wafer Size
100 mm[1]
Accurate?

Gas & chemistry3

Tool type
plasma-enhanced chemical-vapor-deposition (PECVD) system[1]
Accurate?
Process
Plasma-enhanced chemical vapor deposition (PECVD)[1]
Accurate?
Nitride Recipe (High RI) Modification
Increase 2% SiH4/Ar flow to 500 sccm[1]
Accurate?

Configuration & options4

Deposition material
silicon dioxide[1]
Accurate?
Deposition material
silicon nitride[1]
Accurate?
Deposited Materials
Silicon dioxide (oxide) and silicon nitride (SiNx)[1]
Accurate?
Temperature
300 °C[1]
Accurate?
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Tool typeplasma-enhanced chemical-vapor-deposition (PECVD) system[1]
  • ProcessPlasma-enhanced chemical vapor deposition (PECVD)[1]
  • Oxide Recipe Details2% SiH4 in Ar at 400 sccm, N2O at 900 sccm, 60 W at 13.56 MHz, 650 mtorr, 300 °C[1]
  • Nitride Recipe (Low RI) Details2% SiH4 in Ar at 200 sccm, N2 at 2000 sccm, power alternating between 30 W at 13.56 MHz for 6 s and 25 W at 187 kHz for 3 s, 650 mtorr, 300 °C[1]
  • Nitride Recipe (High RI) ModificationIncrease 2% SiH4/Ar flow to 500 sccm[1]
  • Pressure650 mtorr[1]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Not publicly documented

The following facts about the 310 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 310 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 310 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 310 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 310 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 310 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]nanocenter.umd.edu — nanocenter.umd.edunanocenter.umd.edu
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Last updated Oct 11, 2026.

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